An Interactive Simulation Tool for Complex Multilayer Dielectric Devices

Richard G. Southwick, Aaron Sup, Amit Jain, William B. Knowlton

Research output: Contribution to journalArticlepeer-review

63 Scopus citations
Original languageAmerican English
JournalIEEE Transactions on Device and Materials Reliability
Volume11
Issue number2
DOIs
StatePublished - 1 Jun 2011

Keywords

  • energy band
  • high-κ dielectric
  • metal–oxide– semiconductor (MOS) devices
  • simulation

EGS Disciplines

  • Computer Sciences

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