TY - JOUR
T1 - An Interactive Simulation Tool for Complex Multilayer Dielectric Devices
AU - Southwick, Richard G.
AU - Sup, Aaron
AU - Jain, Amit
AU - Knowlton, William B.
PY - 2011/6/1
Y1 - 2011/6/1
KW - energy band
KW - high-κ dielectric
KW - metal–oxide– semiconductor (MOS) devices
KW - simulation
UR - https://scholarworks.boisestate.edu/cs_facpubs/15
UR - https://doi.org/10.1109/tdmr.2011.2129593
UR - http://dx.doi.org/10.1109/tdmr.2011.2129593
U2 - 10.1109/tdmr.2011.2129593
DO - 10.1109/tdmr.2011.2129593
M3 - Article
SN - 1530-4388
VL - 11
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
IS - 2
ER -