Atomic Layer Deposition of Aluminum-Doped Zinc Oxide Characterized by in-situ Transmission Fourier-Transform Infrared Spectrometry

Research output: Contribution to conferencePoster

Abstract

An apparatus was constructed which allowed a Nicolet Magna 550 Fourier Transform Infrared Spectrometer (FTIR) to interface with an industrial Atomic Layer Deposition (ALD) furnace. Aluminum Zinc Oxide films were grown using ALD. The resulting films were characterized through in-situ FTIR. Significant noise was introduced by the method of interfacing the FTIR with the ALD furnace. The film produced little to no absorbance and the resulting signal showed no indication of chemical changes which could not be attributed to random noise. Guidelines to reduce noise and signal loss in future similar experiments were provided.

Original languageAmerican English
StatePublished - 1 Jul 2023
EventIdaho Conference on Undergraduate Research 2023 - Boise State University, Boise, United States
Duration: 1 Jul 2023 → …
https://scholarworks.boisestate.edu/icur/2023/

Conference

ConferenceIdaho Conference on Undergraduate Research 2023
Abbreviated titleICUR 2023
Country/TerritoryUnited States
CityBoise
Period1/07/23 → …
Internet address

Fingerprint

Dive into the research topics of 'Atomic Layer Deposition of Aluminum-Doped Zinc Oxide Characterized by in-situ Transmission Fourier-Transform Infrared Spectrometry'. Together they form a unique fingerprint.

Cite this