Cantilever Based Optical Interfacial Force Microscope

Jeremy R. Bonander; Byung I. Kim

doi:10.1063/1.2898524

Cantilever Based Optical Interfacial Force Microscope

Jeremy R. Bonander, Byung I. Kim

Physics Department

Boise State University

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

Original language	American English
Journal	Applied Physics Letters
DOIs	https://doi.org/10.1063/1.2898524
State	Published - 14 Mar 2008

Keywords

atomic force microscopy
cantilevers
elemental semiconductors
optical feedback
optical microscopy
silicon

EGS Disciplines

Atomic, Molecular and Optical Physics

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title = "Cantilever Based Optical Interfacial Force Microscope",

abstract = " We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.",

keywords = "atomic force microscopy, cantilevers, elemental semiconductors, optical feedback, optical microscopy, silicon",

author = "Bonander, {Jeremy R.} and Kim, {Byung I.}",

year = "2008",

month = mar,

day = "14",

doi = "10.1063/1.2898524",

language = "American English",

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TY - JOUR

T1 - Cantilever Based Optical Interfacial Force Microscope

AU - Bonander, Jeremy R.

AU - Kim, Byung I.

PY - 2008/3/14

Y1 - 2008/3/14

N2 - We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

AB - We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

KW - atomic force microscopy

KW - cantilevers

KW - elemental semiconductors

KW - optical feedback

KW - optical microscopy

KW - silicon

UR - https://scholarworks.boisestate.edu/physics_facpubs/1

U2 - 10.1063/1.2898524

DO - 10.1063/1.2898524

M3 - Article

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

Cantilever Based Optical Interfacial Force Microscope

Abstract

Keywords

EGS Disciplines

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