Skip to main navigation Skip to search Skip to main content

Characterization of Sn, Zn, In, and Sb-containing GeSe alloys for phase-change electronic memory applications

  • Boise State University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Characterization of Sn, Zn, In, and Sb-containing GeSe alloys for phase-change electronic memory applications'. Together they form a unique fingerprint.
Sort by

Material Science