Characterization of Zirconium Oxides Part II: New Insights on the Growth of Zirconia Revealed Through Complementary High-Resolution Mapping Techniques

Corey M. Efaw; Jordan L. Vandegrift; Michael Reynolds; Brian J. Jaques; Hongqiang Hu; Hui Xiong; Michael F. Hurley

doi:10.1016/j.corsci.2020.108491

Characterization of Zirconium Oxides Part II: New Insights on the Growth of Zirconia Revealed Through Complementary High-Resolution Mapping Techniques

Corey M. Efaw, Jordan L. Vandegrift, Michael Reynolds, Brian J. Jaques, Hongqiang Hu, Hui Xiong, Michael F. Hurley

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Raman mapping, scanning Kelvin probe force microscopy (SKPFM), and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM/EDS) were combined to investigate oxidized zirconium alloys. Raman provided spatially resolved phase composition and relative stress state. When coupled with SKPFM, phase composition was correlated to Volta potentials differences. The potential of tetragonal zirconia was lower than the metal zirconium, making the tetragonal phase favorable for reaction with diffusing species, thus hindering further oxidation of the relatively cathodic metal. This provides new insight to the theory of the tetragonal phase being an oxidation barrier.

Original language	American English
Article number	108491
Journal	Corrosion Science
Volume	167
DOIs	https://doi.org/10.1016/j.corsci.2020.108491
State	Published - 1 May 2020

Keywords

Cladding
Oxidation
Raman mapping
SEM/EDS
SKPFM
Zirconium alloys

EGS Disciplines

Materials Science and Engineering

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10.1016/j.corsci.2020.108491

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@article{b1ae2934fa094826943dfb094082286a,

title = "Characterization of Zirconium Oxides Part II: New Insights on the Growth of Zirconia Revealed Through Complementary High-Resolution Mapping Techniques",

abstract = "Raman mapping, scanning Kelvin probe force microscopy (SKPFM), and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM/EDS) were combined to investigate oxidized zirconium alloys. Raman provided spatially resolved phase composition and relative stress state. When coupled with SKPFM, phase composition was correlated to Volta potentials differences. The potential of tetragonal zirconia was lower than the metal zirconium, making the tetragonal phase favorable for reaction with diffusing species, thus hindering further oxidation of the relatively cathodic metal. This provides new insight to the theory of the tetragonal phase being an oxidation barrier.",

keywords = "Cladding, Oxidation, Raman mapping, SEM/EDS, SKPFM, Zirconium alloys",

author = "Efaw, {Corey M.} and Vandegrift, {Jordan L.} and Michael Reynolds and Jaques, {Brian J.} and Hongqiang Hu and Hui Xiong and Hurley, {Michael F.}",

note = "Publisher Copyright: {\textcopyright} 2020 Elsevier Ltd",

year = "2020",

month = may,

day = "1",

doi = "10.1016/j.corsci.2020.108491",

language = "American English",

volume = "167",

}

TY - JOUR

T1 - Characterization of Zirconium Oxides Part II

T2 - New Insights on the Growth of Zirconia Revealed Through Complementary High-Resolution Mapping Techniques

AU - Efaw, Corey M.

AU - Vandegrift, Jordan L.

AU - Reynolds, Michael

AU - Jaques, Brian J.

AU - Hu, Hongqiang

AU - Xiong, Hui

AU - Hurley, Michael F.

PY - 2020/5/1

Y1 - 2020/5/1

N2 - Raman mapping, scanning Kelvin probe force microscopy (SKPFM), and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM/EDS) were combined to investigate oxidized zirconium alloys. Raman provided spatially resolved phase composition and relative stress state. When coupled with SKPFM, phase composition was correlated to Volta potentials differences. The potential of tetragonal zirconia was lower than the metal zirconium, making the tetragonal phase favorable for reaction with diffusing species, thus hindering further oxidation of the relatively cathodic metal. This provides new insight to the theory of the tetragonal phase being an oxidation barrier.

AB - Raman mapping, scanning Kelvin probe force microscopy (SKPFM), and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM/EDS) were combined to investigate oxidized zirconium alloys. Raman provided spatially resolved phase composition and relative stress state. When coupled with SKPFM, phase composition was correlated to Volta potentials differences. The potential of tetragonal zirconia was lower than the metal zirconium, making the tetragonal phase favorable for reaction with diffusing species, thus hindering further oxidation of the relatively cathodic metal. This provides new insight to the theory of the tetragonal phase being an oxidation barrier.

KW - Cladding

KW - Oxidation

KW - Raman mapping

KW - SEM/EDS

KW - SKPFM

KW - Zirconium alloys

UR - http://www.scopus.com/inward/record.url?scp=85078477899&partnerID=8YFLogxK

UR - https://scholarworks.boisestate.edu/mse_facpubs/427/

U2 - 10.1016/j.corsci.2020.108491

DO - 10.1016/j.corsci.2020.108491

M3 - Article

SN - 0010-938X

VL - 167

JO - Corrosion Science

JF - Corrosion Science

M1 - 108491

ER -

Characterization of Zirconium Oxides Part II: New Insights on the Growth of Zirconia Revealed Through Complementary High-Resolution Mapping Techniques

Abstract

Keywords

EGS Disciplines

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