Abstract
A monolithic integrated chip-scale surface plasmon resonance (SPR) sensor is demonstrated. The device consists of a pn photodiode covered with a periodic modified thin metal film whose lattice constant is on the order of the wavelength of light. The device performs real-time measurement of resonant wavelengths of enhanced optical transmission due to surface plasmon resonance, which are influenced by the presence of chemical or biological materials at the device’s surface.
| Original language | American English |
|---|---|
| Pages (from-to) | 1-4 |
| Number of pages | 4 |
| Journal | 52nd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '09) |
| DOIs | |
| State | Published - 1 Aug 2009 |
Keywords
- surface plasmon polariton
- photodiode
- sensor
- CMOS transimpedance amplifier
EGS Disciplines
- Electrical and Computer Engineering
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