Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type II superlattice FPAs

T. J. Rotter, T. Busani, P. Rathi, F. Jaeckel, P. A. Reyes, K. J. Malloy, A. A. Ukhanov, E. Plis, S. Krishna, M. Jaime-Vasquez, N. F. Baril, J. D. Benson, D. A. Tenne

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type II superlattice FPAs'. Together they form a unique fingerprint.

Engineering