Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes

P. J. De Pablo; S. Howell; S. Crittenden; B. Walsh; E. Graugnard; R. Reifenberger

doi:10.1063/1.125501

Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes

P. J. De Pablo
, S. Howell
, S. Crittenden
, B. Walsh
, E. Graugnard
, R. Reifenberger

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.

Original language	English
Pages (from-to)	3941-3943
Number of pages	3
Journal	Applied Physics Letters
Volume	75
Issue number	25
DOIs	https://doi.org/10.1063/1.125501
State	Published - 20 Dec 1999

EGS Disciplines

Mechanical Engineering

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10.1063/1.125501

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title = "Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes",

abstract = "Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.",

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AU - De Pablo, P. J.

AU - Howell, S.

AU - Crittenden, S.

AU - Walsh, B.

AU - Graugnard, E.

AU - Reifenberger, R.

PY - 1999/12/20

Y1 - 1999/12/20

N2 - Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.

AB - Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.

UR - https://www.scopus.com/pages/publications/0000812095

UR - http://dx.doi.org/10.1063/1.125501

U2 - 10.1063/1.125501

DO - 10.1063/1.125501

M3 - Article

AN - SCOPUS:0000812095

SN - 0003-6951

VL - 75

SP - 3941

EP - 3943

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 25

ER -

Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes

Abstract

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