@article{ab2d2a0a9d3c4214a93ce70e7b5a68cb,
title = "Cryogenic to Room Temperature Effects of NBTI in High-k PMOS Devices",
keywords = "current measurement, logic gates, performance evaluation, stress, temperature measurement, thermal stability",
author = "Southwick, {Richard G.} and Purnell, {Shem T.} and Rapp, {Blake A.} and Thompson, {Ryan J.} and Pugmire, {Shane K.} and Ben Kaczer and Tibor Grasser and Knowlton, {William B.} and Rappaport, {Carey M.}",
year = "2011",
month = oct,
day = "16",
doi = "10.1109/IIRW.2011.6142577",
language = "American English",
}