Dynamics of Silver Photo-Diffusion into Ge-Chalcogenide Films: Time-Resolved Neutron Reflectometry

M. Ailavajhala, M. R. Latif, K. Wolf, M. Mitkova, M. W.A. Skoda

Research output: Contribution to journalArticlepeer-review

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Abstract

Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films and neutron reflectometry is a suitable technique probing time evolution of the depth profiles without damaging the sample by the probe beam itself. In this paper, we report the results of time-resolved neutron reflectivity measurements of a-Ge 40 Se 60 /Ag/ Si films taken while the films are exposed to visible light. From the measurements, we found enormous changes in the neutron reflectivity profile, including a loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which occurred about 50 min after starting illumination. At this stage, a clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.

Original languageAmerican English
JournalJournal of Physics: Conference Series
DOIs
StatePublished - 1 Jan 2015

EGS Disciplines

  • Electrical and Computer Engineering

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