Effects of Circuit-Level Stress on Inverter Performance and MOSFET Characteristics

Nate Stutzke; Betsy J. Cheek; Santosh Kumar; R. Jacob Baker; Amy J. Moll; William B. Knowlton

doi:10.1109/IRWS.2003.1283304

Effects of Circuit-Level Stress on Inverter Performance and MOSFET Characteristics

Nate Stutzke, Betsy J. Cheek, Santosh Kumar, R. Jacob Baker, Amy J. Moll, William B. Knowlton

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Original language	American English
Journal	Electrical and Computer Engineering Faculty Publications and Presentations
DOIs	https://doi.org/10.1109/IRWS.2003.1283304
State	Published - 1 Jan 2003

Keywords

circuit simulation
degradation
inverters
leakage current
MOSFET circuits
stress

EGS Disciplines

Electrical and Computer Engineering

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10.1109/IRWS.2003.1283304License: Unspecified

http://dx.doi.org/10.1109/IRWS.2003.1283304

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@article{b10b948c238c4a76941dbeed254ab421,

title = "Effects of Circuit-Level Stress on Inverter Performance and MOSFET Characteristics",

keywords = "circuit simulation, degradation, inverters, leakage current, MOSFET circuits, stress",

author = "Nate Stutzke and Cheek, {Betsy J.} and Santosh Kumar and Baker, {R. Jacob} and Moll, {Amy J.} and Knowlton, {William B.}",

year = "2003",

month = jan,

day = "1",

doi = "10.1109/IRWS.2003.1283304",

language = "American English",

}

TY - JOUR

T1 - Effects of Circuit-Level Stress on Inverter Performance and MOSFET Characteristics

AU - Stutzke, Nate

AU - Cheek, Betsy J.

AU - Kumar, Santosh

AU - Baker, R. Jacob

AU - Moll, Amy J.

AU - Knowlton, William B.

PY - 2003/1/1

Y1 - 2003/1/1

KW - circuit simulation

KW - degradation

KW - inverters

KW - leakage current

KW - MOSFET circuits

KW - stress

UR - https://scholarworks.boisestate.edu/electrical_facpubs/299

UR - http://dx.doi.org/10.1109/IRWS.2003.1283304

U2 - 10.1109/IRWS.2003.1283304

DO - 10.1109/IRWS.2003.1283304

M3 - Article

JO - Electrical and Computer Engineering Faculty Publications and Presentations

JF - Electrical and Computer Engineering Faculty Publications and Presentations

ER -

Effects of Circuit-Level Stress on Inverter Performance and MOSFET Characteristics

Keywords

EGS Disciplines

Access to Document

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