@inproceedings{f0e7c25b16a041e9886797563ac07760,
title = "Experimental micromechanics study of lamellar TiAl",
abstract = "A unique micro-scale full field deformation measurement technique called electron speckle photography is exploited to investigate the deformation mechanism of lamellar TiAl. We find the size of the specimen used and the area of strain measurement affect the mechanical properties thus obtained. The strain distribution inside a grain is highly heterogeneous. The grain boundary is much stiffer than the interior of the grain. We also observe several interesting phenomena of the material when a crack is present. Crack speed tends to slow down when the crack approaches a grain boundary. Within a grain the slowest propagation speed is when the lamellar layers are perpendicular to the crack. Crack may jump across a grain boundary and its propagation direction may be predicted by the strain concentration congregated near the grain boundary. By mapping the deformation field surrounding the crack tip, we can evaluate the mode mixity from the speckle results at different stages of crack propagation.",
author = "Chiang, {Fu Pen} and Gunes Uzer and Yi Ding and Rosenberger, {Andrew H.}",
year = "2007",
language = "English",
isbn = "9780873396882",
series = "TMS Annual Meeting",
pages = "37--47",
booktitle = "Materials Processing and Manufacturing Division Symposium",
note = "136th TMS Annual Meeting, 2007 ; Conference date: 25-02-2007 Through 01-03-2007",
}