Experimental Observations of Gated Field Emitter Failures

Jim Browning; Nicol E. McGruer; W. J. Bintz; M. Gilmore

doi:10.1109/55.144999

Experimental Observations of Gated Field Emitter Failures

Jim Browning, Nicol E. McGruer, W. J. Bintz, M. Gilmore

Electrical Engineering Department

Northeastern University

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 kΩ, the arc is continuous, while for series resistors greater than 10 kΩ, the arc is intermittent.

Original language	English
Pages (from-to)	167-169
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	13
Issue number	3
DOIs	https://doi.org/10.1109/55.144999
State	Published - Mar 1992

Access to Document

10.1109/55.144999

Cite this

@article{5074ff0c254d4d2983cb4f50c5173e2f,

title = "Experimental Observations of Gated Field Emitter Failures",

abstract = "Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 kΩ, the arc is continuous, while for series resistors greater than 10 kΩ, the arc is intermittent.",

author = "Jim Browning and McGruer, {Nicol E.} and Bintz, {W. J.} and M. Gilmore",

year = "1992",

month = mar,

doi = "10.1109/55.144999",

language = "English",

volume = "13",

pages = "167--169",

number = "3",

}

TY - JOUR

T1 - Experimental Observations of Gated Field Emitter Failures

AU - Browning, Jim

AU - McGruer, Nicol E.

AU - Bintz, W. J.

AU - Gilmore, M.

PY - 1992/3

Y1 - 1992/3

N2 - Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 kΩ, the arc is continuous, while for series resistors greater than 10 kΩ, the arc is intermittent.

AB - Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 kΩ, the arc is continuous, while for series resistors greater than 10 kΩ, the arc is intermittent.

UR - http://www.scopus.com/inward/record.url?scp=0026838813&partnerID=8YFLogxK

U2 - 10.1109/55.144999

DO - 10.1109/55.144999

M3 - Article

AN - SCOPUS:0026838813

SN - 0741-3106

VL - 13

SP - 167

EP - 169

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 3

ER -

Experimental Observations of Gated Field Emitter Failures

Abstract

Access to Document

Other files and links

Fingerprint

Cite this