Abstract
The recently developed Near-Infrared Raman Imaging Microscope (NIRIM) allows simultaneous collection of spectral and spatial information in one scan of a charge coupled device detector. This article reviews the basic principles of spectral imaging as well as the advantages of the NIRIM method relative to other imaging methods.
Original language | English |
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Pages (from-to) | 28-37 |
Number of pages | 10 |
Journal | Spectroscopy (Santa Monica) |
Volume | 15 |
Issue number | 9 |
State | Published - 2000 |