Abstract
The recently developed Near-Infrared Raman Imaging Microscope (NIRIM) allows simultaneous collection of spectral and spatial information in one scan of a charge coupled device detector. This article reviews the basic principles of spectral imaging as well as the advantages of the NIRIM method relative to other imaging methods.
| Original language | English |
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| Pages (from-to) | 28-37 |
| Number of pages | 10 |
| Journal | Spectroscopy (Santa Monica) |
| Volume | 15 |
| Issue number | 9 |
| State | Published - 2000 |