Guest editorial: Introduction to the special issue on the 2005 international integrated reliability workshop

Research output: Contribution to journal › Editorial

Original language	English
Article number	1673697
Pages (from-to)	115-116
Number of pages	2
Journal	IEEE Transactions on Device and Materials Reliability
Volume	6
Issue number	2
DOIs	https://doi.org/10.1109/TDMR.2006.877374
State	Published - Jun 2006

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@article{66e416635bbd47949f7aaad85a38f440,

title = "Guest editorial: Introduction to the special issue on the 2005 international integrated reliability workshop",

author = "Conley, \{John F.\} and Yuan Chen and Bill Knowlton and Tim Sullivan and Bill Tonti",

year = "2006",

month = jun,

doi = "10.1109/TDMR.2006.877374",

language = "English",

volume = "6",

pages = "115--116",

number = "2",

}

TY - JOUR

T1 - Guest editorial

T2 - Introduction to the special issue on the 2005 international integrated reliability workshop

AU - Conley, John F.

AU - Chen, Yuan

AU - Knowlton, Bill

AU - Sullivan, Tim

AU - Tonti, Bill

PY - 2006/6

Y1 - 2006/6

UR - https://www.scopus.com/pages/publications/33748103175

U2 - 10.1109/TDMR.2006.877374

DO - 10.1109/TDMR.2006.877374

M3 - Editorial

AN - SCOPUS:33748103175

SN - 1530-4388

VL - 6

SP - 115

EP - 116

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 2

M1 - 1673697

ER -