Impact of Single pMOSFET Dielectric Degradation on NAND Circuit Performance

D. Estrada, M. L. Ogas, R. G. Southwick, P. M. Price, R. J. Baker, W. B. Knowlton

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Microelectronics Reliability
State	Published - 1 Mar 2008

EGS Disciplines

TY - JOUR

T1 - Impact of Single pMOSFET Dielectric Degradation on NAND Circuit Performance

AU - Estrada, D.

AU - Ogas, M. L.

AU - Southwick, R. G.

AU - Price, P. M.

AU - Baker, R. J.

AU - Knowlton, W. B.

PY - 2008/3/1

Y1 - 2008/3/1

UR - https://scholarworks.boisestate.edu/mse_facpubs/91

UR - https://doi.org/10.1016/j.microrel.2007.09.002

M3 - Article

SN - 0026-2714

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -