@inproceedings{15fa2d869cf744d1a004e6d41d56f14b,
title = "Infrared microscopy of joule heating in graphene field effect transistors",
abstract = "We use infrared microscopy to image the temperature profile of graphene field-effect transistors operating at constant source to drain current bias. We find a peak in the temperature profile, i.e. a {"}hot spot{"} appears near the drain (anode) electrode of the graphene sheet at high current while operating in the hole-doped regime. We shift the hot spot position on the graphene sheet by tuning the gate voltage into an ambipolar transport regime. This shows a direct demonstration and manipulation of Joule heating in graphene transistors.",
author = "Bae, {Myung Ho} and Ong, {Zhun Yong} and David Estrada and Eric Pop",
year = "2009",
language = "English",
isbn = "9789810836948",
series = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009",
pages = "818--821",
booktitle = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009",
note = "2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009 ; Conference date: 26-07-2009 Through 30-07-2009",
}