Intramembrane Congestion Effects on Lysenin Channel Voltage-Induced Gating

Eric Krueger; Sheenah Bryant; Nisha Shrestha; Tyler Clark; Charles Hanna; David Pink; Daniel Fologea

Intramembrane Congestion Effects on Lysenin Channel Voltage-Induced Gating

Eric Krueger, Sheenah Bryant, Nisha Shrestha, Tyler Clark, Charles Hanna, David Pink, Daniel Fologea

Physics Department

Research output: Contribution to journal › Article › peer-review

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Original language	American English
Journal	European Biophysics Journal
State	Published - 1 Mar 2016

Keywords

lysenin
crowding
lipid rafts
sphingomyelin
open probability
voltage-gating

EGS Disciplines

Physics

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Intramembrane Congestion Effects on Lysenin Channel Voltage-InducFinal published version, 416 KBLicense: Unspecified
Intramembrane Congestion Effects on Lysenin Channel Voltage-InducFinal published version, 416 KBLicense: Unspecified

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@article{b61e40ef2b534461b1263da666fb8b4a,

title = "Intramembrane Congestion Effects on Lysenin Channel Voltage-Induced Gating",

keywords = "lysenin, crowding, lipid rafts, sphingomyelin, open probability, voltage-gating",

author = "Eric Krueger and Sheenah Bryant and Nisha Shrestha and Tyler Clark and Charles Hanna and David Pink and Daniel Fologea",

year = "2016",

month = mar,

day = "1",

language = "American English",

journal = "European Biophysics Journal",

issn = "0175-7571",

publisher = "Springer Science and Business Media Deutschland GmbH",

}

TY - JOUR

T1 - Intramembrane Congestion Effects on Lysenin Channel Voltage-Induced Gating

AU - Krueger, Eric

AU - Bryant, Sheenah

AU - Shrestha, Nisha

AU - Clark, Tyler

AU - Hanna, Charles

AU - Pink, David

AU - Fologea, Daniel

PY - 2016/3/1

Y1 - 2016/3/1

KW - lysenin

KW - crowding

KW - lipid rafts

KW - sphingomyelin

KW - open probability

KW - voltage-gating

UR - https://scholarworks.boisestate.edu/physics_facpubs/180

M3 - Article

SN - 0175-7571

JO - European Biophysics Journal

JF - European Biophysics Journal

ER -

Intramembrane Congestion Effects on Lysenin Channel Voltage-Induced Gating

Keywords

EGS Disciplines

Access to Document

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