Introduction to the special issue on the 2007 international integrated reliability workshop

Research output: Contribution to journal › Editorial

Original language	English
Article number	4655592
Pages (from-to)	490
Number of pages	1
Journal	IEEE Transactions on Device and Materials Reliability
Volume	8
Issue number	3
DOIs	https://doi.org/10.1109/TDMR.2008.2006011
State	Published - Sep 2008

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@article{a68f09621c1e43ae842ab98d472a8d19,

title = "Introduction to the special issue on the 2007 international integrated reliability workshop",

author = "Lenahan, \{Patrick M.\} and Bill Knowlton and Conley, \{John F.\} and Bill Tonti and John Suehle and Tibor Grasser",

year = "2008",

month = sep,

doi = "10.1109/TDMR.2008.2006011",

language = "English",

volume = "8",

pages = "490",

number = "3",

}

TY - JOUR

T1 - Introduction to the special issue on the 2007 international integrated reliability workshop

AU - Lenahan, Patrick M.

AU - Knowlton, Bill

AU - Conley, John F.

AU - Tonti, Bill

AU - Suehle, John

AU - Grasser, Tibor

PY - 2008/9

Y1 - 2008/9

UR - https://www.scopus.com/pages/publications/54949113286

U2 - 10.1109/TDMR.2008.2006011

DO - 10.1109/TDMR.2008.2006011

M3 - Editorial

AN - SCOPUS:54949113286

SN - 1530-4388

VL - 8

SP - 490

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 3

M1 - 4655592

ER -