Investigation of Circuit-Level Oxide Degradation and Its Effect on CMOS Inverter Operation and MOSFET Characteristics

Betsy J. Cheek; Nate Stutzke; Santosh Kumar; R. Jacob Baker; Amy J. Moll; William B. Knowlton

doi:10.1109/RELPHY.2004.1315309

Investigation of Circuit-Level Oxide Degradation and Its Effect on CMOS Inverter Operation and MOSFET Characteristics

Betsy J. Cheek, Nate Stutzke, Santosh Kumar, R. Jacob Baker, Amy J. Moll, William B. Knowlton

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Original language	American English
Journal	Electrical and Computer Engineering Faculty Publications and Presentations
DOIs	https://doi.org/10.1109/RELPHY.2004.1315309
State	Published - 1 Jan 2004

Keywords

circuit model
circuit reliability
CMOS
dielectric breakdown
gate oxide reliability
inverter degradation

EGS Disciplines

Electrical and Computer Engineering

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10.1109/RELPHY.2004.1315309License: Unspecified

http://dx.doi.org/10.1109/RELPHY.2004.1315309

Cite this

@article{7de651830e7a4859a41770906215655c,

title = "Investigation of Circuit-Level Oxide Degradation and Its Effect on CMOS Inverter Operation and MOSFET Characteristics",

keywords = "circuit model, circuit reliability, CMOS, dielectric breakdown, gate oxide reliability, inverter degradation",

author = "Cheek, {Betsy J.} and Nate Stutzke and Santosh Kumar and Baker, {R. Jacob} and Moll, {Amy J.} and Knowlton, {William B.}",

year = "2004",

month = jan,

day = "1",

doi = "10.1109/RELPHY.2004.1315309",

language = "American English",

}

TY - JOUR

T1 - Investigation of Circuit-Level Oxide Degradation and Its Effect on CMOS Inverter Operation and MOSFET Characteristics

AU - Cheek, Betsy J.

AU - Stutzke, Nate

AU - Kumar, Santosh

AU - Baker, R. Jacob

AU - Moll, Amy J.

AU - Knowlton, William B.

PY - 2004/1/1

Y1 - 2004/1/1

KW - circuit model

KW - circuit reliability

KW - CMOS

KW - dielectric breakdown

KW - gate oxide reliability

KW - inverter degradation

UR - https://scholarworks.boisestate.edu/electrical_facpubs/289

UR - http://dx.doi.org/10.1109/RELPHY.2004.1315309

U2 - 10.1109/RELPHY.2004.1315309

DO - 10.1109/RELPHY.2004.1315309

M3 - Article

JO - Electrical and Computer Engineering Faculty Publications and Presentations

JF - Electrical and Computer Engineering Faculty Publications and Presentations

ER -

Investigation of Circuit-Level Oxide Degradation and Its Effect on CMOS Inverter Operation and MOSFET Characteristics

Keywords

EGS Disciplines

Access to Document

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