Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate

S. Meassick; Z. Xia; C. Chan; J. Browning

doi:10.1109/IVMC.1993.700307

Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate

S. Meassick
, Z. Xia
, C. Chan
, J. Browning

Electrical Engineering Department

Northeastern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	115-116
Number of pages	2
ISBN (Electronic)	0780308522, 9780780308527
DOIs	https://doi.org/10.1109/IVMC.1993.700307
State	Published - 1993
Event	6th IEEE International Vacuum Microelectronics Conference, IVMC 1993 - Newport, United States Duration: 12 Jul 1993 → 15 Jul 1993

Publication series

Name	Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993

Conference

Conference	6th IEEE International Vacuum Microelectronics Conference, IVMC 1993
Country/Territory	United States
City	Newport
Period	12/07/93 → 15/07/93

Access to Document

10.1109/IVMC.1993.700307

Cite this

Meassick, S., Xia, Z., Chan, C., & Browning, J. (1993). Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate. In Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993 (pp. 115-116). Article 700307 (Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVMC.1993.700307

Meassick, S. ; Xia, Z. ; Chan, C. et al. / Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate. Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993. Institute of Electrical and Electronics Engineers Inc., 1993. pp. 115-116 (Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993).

@inproceedings{ff537e9c277045dfb239e0bc00555255,

title = "Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate",

author = "S. Meassick and Z. Xia and C. Chan and J. Browning",

year = "1993",

doi = "10.1109/IVMC.1993.700307",

language = "English",

series = "Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "115--116",

booktitle = "Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993",

address = "United States",

note = "6th IEEE International Vacuum Microelectronics Conference, IVMC 1993 ; Conference date: 12-07-1993 Through 15-07-1993",

}

Meassick, S, Xia, Z, Chan, C & Browning, J 1993, Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate. in Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993., 700307, Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993, Institute of Electrical and Electronics Engineers Inc., pp. 115-116, 6th IEEE International Vacuum Microelectronics Conference, IVMC 1993, Newport, United States, 12/07/93. https://doi.org/10.1109/IVMC.1993.700307

Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate. / Meassick, S.; Xia, Z.; Chan, C. et al.
Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993. Institute of Electrical and Electronics Engineers Inc., 1993. p. 115-116 700307 (Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate

AU - Meassick, S.

AU - Xia, Z.

AU - Chan, C.

AU - Browning, J.

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/85068472935

U2 - 10.1109/IVMC.1993.700307

DO - 10.1109/IVMC.1993.700307

M3 - Conference contribution

AN - SCOPUS:85068472935

T3 - Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993

SP - 115

EP - 116

BT - Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 6th IEEE International Vacuum Microelectronics Conference, IVMC 1993

Y2 - 12 July 1993 through 15 July 1993

ER -

Meassick S, Xia Z, Chan C, Browning J. Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate. In Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993. Institute of Electrical and Electronics Engineers Inc. 1993. p. 115-116. 700307. (Proceedings of IEEE 6th International Vacuum Microelectronics Conference, IVMC 1993). doi: 10.1109/IVMC.1993.700307

Investigation of the operating modes of gated vacuum field emitter arrays to reduce the failure rate

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