Ion and Electron Energies in Gated Field Emitter Failures

J. Browning, S. Meassick, Z. Xia, C. Chan, N. McGruer

Research output: Contribution to journalArticlepeer-review

Abstract

Intrinsic failures of gated field emitters appear to be cathodic vacuum arcs [4]. Plumes of ions and electrons were measured during these failures. Measurements of ion energies of 80 eV and electron energies of 6 eV during failures confirm that the failures are microscopic cathodic arcs.

Original languageEnglish
Pages (from-to)259-260
Number of pages2
JournalIEEE Transactions on Plasma Science
Volume21
Issue number2
DOIs
StatePublished - Apr 1993

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