Ion and Electron Energies in Gated Field Emitter Failures

J. Browning; S. Meassick; Z. Xia; C. Chan; N. McGruer

doi:10.1109/27.219398

Ion and Electron Energies in Gated Field Emitter Failures

J. Browning
, S. Meassick
, Z. Xia
, C. Chan
, N. McGruer

Electrical Engineering Department

Northeastern University

Research output: Contribution to journal › Article › peer-review

Abstract

Intrinsic failures of gated field emitters appear to be cathodic vacuum arcs [4]. Plumes of ions and electrons were measured during these failures. Measurements of ion energies of 80 eV and electron energies of 6 eV during failures confirm that the failures are microscopic cathodic arcs.

Original language	English
Pages (from-to)	259-260
Number of pages	2
Journal	IEEE Transactions on Plasma Science
Volume	21
Issue number	2
DOIs	https://doi.org/10.1109/27.219398
State	Published - Apr 1993

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title = "Ion and Electron Energies in Gated Field Emitter Failures",

abstract = "Intrinsic failures of gated field emitters appear to be cathodic vacuum arcs [4]. Plumes of ions and electrons were measured during these failures. Measurements of ion energies of 80 eV and electron energies of 6 eV during failures confirm that the failures are microscopic cathodic arcs.",

author = "J. Browning and S. Meassick and Z. Xia and C. Chan and N. McGruer",

year = "1993",

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language = "English",

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AU - Browning, J.

AU - Meassick, S.

AU - Xia, Z.

AU - Chan, C.

AU - McGruer, N.

PY - 1993/4

Y1 - 1993/4

N2 - Intrinsic failures of gated field emitters appear to be cathodic vacuum arcs [4]. Plumes of ions and electrons were measured during these failures. Measurements of ion energies of 80 eV and electron energies of 6 eV during failures confirm that the failures are microscopic cathodic arcs.

AB - Intrinsic failures of gated field emitters appear to be cathodic vacuum arcs [4]. Plumes of ions and electrons were measured during these failures. Measurements of ion energies of 80 eV and electron energies of 6 eV during failures confirm that the failures are microscopic cathodic arcs.

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U2 - 10.1109/27.219398

DO - 10.1109/27.219398

M3 - Article

AN - SCOPUS:0027583014

SN - 0093-3813

VL - 21

SP - 259

EP - 260

JO - IEEE Transactions on Plasma Science

JF - IEEE Transactions on Plasma Science

IS - 2

ER -

Ion and Electron Energies in Gated Field Emitter Failures

Abstract

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