Lattice dynamics in Ba xSr 1-xTiO 3 thin films studied by Raman spectroscopy

D. A. Tenne, A. Soukiassian, X. X. Xi, H. Choosuwan, R. Guo, A. S. Bhalla

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

We present a Raman spectroscopy study of the lattice-dynamical properties of the Ba xSr 1-xTiO 3 thin films with x=0.05, 0.1, 0.2, 0.35, and 0.5 in the temperature range of 5-300 K. Soft phonon modes were observed, and the temperature dependence of their frequencies and Raman intensities were investigated. The Raman spectra of the Ba xSr 1-xTiO 3 films are compared with the single crystals of the same compositions. The essential differences in the lattice-dynamical properties of the thin films and single crystals are observed, such as the forbidden first-order Raman scattering in the films well above the phase-transition temperature in bulk, hardening of the soft phonon modes in films compared to crystals, and significantly larger range of the soft-mode overdamping in the films. On the other hand, the lattice-dynamics behavior in the Ba xSr 1-xTiO 3 films is found similar to that of the relaxor ferroelectrics. Analogous to the relaxors, the presence of the polar nanoregions existing in the films at the temperatures above the bulk ferroelectric phase transition explains the specific lattice-dynamical properties of the Ba xSr 1-xTiO 3 thin films.

Original languageEnglish
Pages (from-to)6597-6605
Number of pages9
JournalJournal of Applied Physics
Volume96
Issue number11
DOIs
StatePublished - 1 Dec 2004

Fingerprint

Dive into the research topics of 'Lattice dynamics in Ba xSr 1-xTiO 3 thin films studied by Raman spectroscopy'. Together they form a unique fingerprint.

Cite this