TY - JOUR
T1 - Lower Lipschitz bounds for phase retrieval from locally supported measurements
AU - Iwen, Mark A.
AU - Merhi, Sami
AU - Perlmutter, Michael
N1 - Publisher Copyright:
© 2019 Elsevier Inc.
PY - 2019/9
Y1 - 2019/9
N2 - In this short note, we consider the worst case noise robustness of any phase retrieval algorithm which aims to reconstruct all nonvanishing vectors x∈Cd (up to a single global phase multiple) from the magnitudes of shifted local correlation measurements. Examples of such measurements include both spectrogram measurements of x using locally supported windows and masked Fourier transform intensity measurements of x using bandlimited masks. As a result, the robustness results considered herein apply to a wide range of both ptychographic and Fourier ptychographic imaging scenarios. In particular, the main results imply that the accurate recovery of high-resolution images of extremely large samples using highly localized probes is likely to require an extremely large number of measurements in order to be robust to worst case measurement noise, independent of the recovery algorithm employed. Furthermore, recent pushes to achieve high-speed and high-resolution ptychographic imaging of integrated circuits for process verification and failure analysis will likely need to carefully balance probe design (e.g., their effective time–frequency support) against the total number of measurements acquired in order for their imaging techniques to be stable to measurement noise, no matter what reconstruction algorithms are applied.
AB - In this short note, we consider the worst case noise robustness of any phase retrieval algorithm which aims to reconstruct all nonvanishing vectors x∈Cd (up to a single global phase multiple) from the magnitudes of shifted local correlation measurements. Examples of such measurements include both spectrogram measurements of x using locally supported windows and masked Fourier transform intensity measurements of x using bandlimited masks. As a result, the robustness results considered herein apply to a wide range of both ptychographic and Fourier ptychographic imaging scenarios. In particular, the main results imply that the accurate recovery of high-resolution images of extremely large samples using highly localized probes is likely to require an extremely large number of measurements in order to be robust to worst case measurement noise, independent of the recovery algorithm employed. Furthermore, recent pushes to achieve high-speed and high-resolution ptychographic imaging of integrated circuits for process verification and failure analysis will likely need to carefully balance probe design (e.g., their effective time–frequency support) against the total number of measurements acquired in order for their imaging techniques to be stable to measurement noise, no matter what reconstruction algorithms are applied.
UR - http://www.scopus.com/inward/record.url?scp=85068770030&partnerID=8YFLogxK
UR - https://doi.org/10.1016/j.acha.2019.01.004
U2 - 10.1016/j.acha.2019.01.004
DO - 10.1016/j.acha.2019.01.004
M3 - Letter
AN - SCOPUS:85068770030
SN - 1063-5203
VL - 47
SP - 526
EP - 538
JO - Applied and Computational Harmonic Analysis
JF - Applied and Computational Harmonic Analysis
IS - 2
ER -