TY - JOUR
T1 - Magnetization and domain patterns in martensitic NiMnGa films on Si(100) wafer
AU - Chernenko, V. A.
AU - Lopez Anton, R.
AU - Besseghini, S.
AU - Barandiaran, J. M.
AU - Ohtsuka, M.
AU - Gambardella, A.
AU - Müllner, P.
PY - 2008
Y1 - 2008
N2 - A series of Ni51.4Mn28.3Ga20.3 films sputter-deposited on Si(100) wafer (with 500 nm thick buffer layer of SiN x) and annealed at 800°C for 1h. are investigated with respect to their transformation behavior and magnetic properties. The film thickness, d, varies from 0.1 to 5.0 μm. Resistivity measurements reveal martensitic transformation above room temperature for all the films except for 0.1 μm-thick film which is transforming at much lower temperature. The magnetic characteristics of martensitic films such as susceptibility and anisotropy field extracted from the in-plane and out-of-plane magnetization curves show film thickness dependence likewise Curie temperature obtained from the resistivity curves. The surface topography and micromagnetic structure are studied by scanning probe microscopy. A stripe magnetic domain pattern featuring a large out-of-plane magnetization component is found in the films. The domain width, δ, depends on the film thickness, d, as δ - √d.
AB - A series of Ni51.4Mn28.3Ga20.3 films sputter-deposited on Si(100) wafer (with 500 nm thick buffer layer of SiN x) and annealed at 800°C for 1h. are investigated with respect to their transformation behavior and magnetic properties. The film thickness, d, varies from 0.1 to 5.0 μm. Resistivity measurements reveal martensitic transformation above room temperature for all the films except for 0.1 μm-thick film which is transforming at much lower temperature. The magnetic characteristics of martensitic films such as susceptibility and anisotropy field extracted from the in-plane and out-of-plane magnetization curves show film thickness dependence likewise Curie temperature obtained from the resistivity curves. The surface topography and micromagnetic structure are studied by scanning probe microscopy. A stripe magnetic domain pattern featuring a large out-of-plane magnetization component is found in the films. The domain width, δ, depends on the film thickness, d, as δ - √d.
KW - Ferromagnetic shape memory alloys
KW - Magnetic domain structure
KW - Magnetization
KW - NiMnGa/Si(100) thin film composites
UR - http://www.scopus.com/inward/record.url?scp=60349120209&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/amr.52.35
DO - 10.4028/www.scientific.net/amr.52.35
M3 - Conference article
AN - SCOPUS:60349120209
SN - 1022-6680
VL - 52
SP - 35
EP - 43
JO - Advanced Materials Research
JF - Advanced Materials Research
T2 - International Conference on Ferromagnetic Shape Memory Alloys
Y2 - 14 November 2007 through 16 November 2007
ER -