Measurement of gated field emitter failures

M. Gilmore; N. E. McGruer; J. Browning; W. J. Bintz

doi:10.1063/1.1144181

Measurement of gated field emitter failures

M. Gilmore, N. E. McGruer, J. Browning, W. J. Bintz

Electrical Engineering Department

Northeastern University

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The emerging field of vacuum microelectronics has many promising applications including flat-panel displays, microwave devices, and ionization sources. The technology is based on arrays of microfabricated micrometer-scaled gated field emitters. Applications are currently limited by unacceptable reliability due primarily to failures of individual field emitters. The failure of an individual emitter produces a characteristic electrical pulse. A circuit is used to monitor and count these pulses. The technique provides a powerful tool for exploration of stable operating regimes for vacuum microelectronic devices and may be useful in other areas in which vacuum discharges must be monitored.

Original language	English
Pages (from-to)	581-582
Number of pages	2
Journal	Review of Scientific Instruments
Volume	64
Issue number	2
DOIs	https://doi.org/10.1063/1.1144181
State	Published - 1993

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title = "Measurement of gated field emitter failures",

abstract = "The emerging field of vacuum microelectronics has many promising applications including flat-panel displays, microwave devices, and ionization sources. The technology is based on arrays of microfabricated micrometer-scaled gated field emitters. Applications are currently limited by unacceptable reliability due primarily to failures of individual field emitters. The failure of an individual emitter produces a characteristic electrical pulse. A circuit is used to monitor and count these pulses. The technique provides a powerful tool for exploration of stable operating regimes for vacuum microelectronic devices and may be useful in other areas in which vacuum discharges must be monitored.",

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AB - The emerging field of vacuum microelectronics has many promising applications including flat-panel displays, microwave devices, and ionization sources. The technology is based on arrays of microfabricated micrometer-scaled gated field emitters. Applications are currently limited by unacceptable reliability due primarily to failures of individual field emitters. The failure of an individual emitter produces a characteristic electrical pulse. A circuit is used to monitor and count these pulses. The technique provides a powerful tool for exploration of stable operating regimes for vacuum microelectronic devices and may be useful in other areas in which vacuum discharges must be monitored.

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Measurement of gated field emitter failures

Abstract

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