Measurements of electron-RF interactions and noise in a low frequency crossed-field amplifier

J. Browning, C. Chan, J. Ye

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

A low-frequency (100 to 200 MHz), low-power crossed-field amplifier has been constructed for studying nonlinear RF-wave-electron interactions, for investigating noise mechanisms, and for verifying numerical simulations by using in situ diagnostics during amplification. Operating in the injected-beam mode, the device has achieved gain as high as 7 dB at 150 MHz with a 10 W drive. Measurements of the local RF field in two dimensions show gain in the local field at the output end of the circuit. Measurements of the electron density profile verify the predicted cycloidal beam pattern, and measurements during amplification show local electron density increases near the anode. Measurements of the noise using an RF probe indicate noise generation during secondary electron emission from the sole.

Original languageEnglish
Pages (from-to)537-540
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting, IEDM
StatePublished - Dec 1990
Event1990 International Electron Devices Meeting - San Francisco, CA, USA
Duration: 9 Dec 199012 Dec 1990

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