Abstract
This article outlines the difficulties associated with measuring quantum yields for solid-state samples using a high-pressure mercury arc lamp as the irradiation source. Details are given for the conversion of an inexpensive frequency-doubled neodymium-doped yttrium aluminum garnet (Nd:YAG) diode laser pointer module into a viable irradiation source. The modified Nd:YAG laser was incorporated into a computer-controlled system, which allowed for the simultaneous irradiation and spectroscopic monitoring of the sample. The data obtained with the Nd:YAG diode laser system show far less scatter than data obtained with a high-pressure Hg arc lamp, and consequently the degradation rates obtained with the laser system could be calculated with far greater accuracy.
| Original language | English |
|---|---|
| Article number | 074104 |
| Journal | Review of Scientific Instruments |
| Volume | 78 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2007 |
Keywords
- Equipment Design
- Equipment Failure Analysis
- Lasers
- Lighting/instrumentation
- Materials Testing/instrumentation
- Photometry/instrumentation
- Pressure
- Quantum Theory
- Radiation Dosage
- Radiometry/instrumentation
- Reproducibility of Results
- Semiconductors
- Sensitivity and Specificity
- Spectrum Analysis/instrumentation