Mixed mode crack tip deformation in lamellar TiAl mapped by digital electron speckle photography

Fu Pen Chiang, Gunes Uzer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Brazilian disk specimens made of lamellar TiAl were tested under compression with the central crack oriented at different angles with respect to the loading direction. Micron and sub-micron sized speckles made of gold were created onto the specimen surface via a physical vapor deposition process. The specimens were tested in the vacuum chamber of a scanning electron microscope. Electron speckle images of the specimen under different stages of loading were recorded digitally and processed through an algorithm called CASI (Computer Aided Speckle Interferometry). Full field deformation patterns were obtained showing the characteristics of the crack propagation in TiAl under mixed mode loading conditions.

Original languageEnglish
Title of host publicationSociety for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009
Pages1008-1015
Number of pages8
StatePublished - 2009
EventSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009 - Albuquerque, NM, United States
Duration: 1 Jun 20094 Jun 2009

Publication series

NameSociety for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009
Volume2

Conference

ConferenceSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009
Country/TerritoryUnited States
CityAlbuquerque, NM
Period1/06/094/06/09

Fingerprint

Dive into the research topics of 'Mixed mode crack tip deformation in lamellar TiAl mapped by digital electron speckle photography'. Together they form a unique fingerprint.

Cite this