New Metric Describes Edge Noise in Bilevel Images

Elisa H. Barney Smith

doi:10.1117/2.1200910.1829

New Metric Describes Edge Noise in Bilevel Images

Elisa H. Barney Smith

Electrical Engineering Department

Research output: Contribution to journal › Article › peer-review

Abstract

A new approach enables quantitative and qualitative characterization of varying edge noise even if the additive noise level is constant.

Original language	American English
Journal	SPIE Online Newsroom
DOIs	https://doi.org/10.1117/2.1200910.1829
State	Published - 13 Oct 2009

EGS Disciplines

Electrical and Computer Engineering

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@article{76ed1c67091a4f1ab5e06a7df45f6384,

title = "New Metric Describes Edge Noise in Bilevel Images",

abstract = " A new approach enables quantitative and qualitative characterization of varying edge noise even if the additive noise level is constant.",

author = "\{Barney Smith\}, \{Elisa H.\}",

year = "2009",

month = oct,

day = "13",

doi = "10.1117/2.1200910.1829",

language = "American English",

}

TY - JOUR

T1 - New Metric Describes Edge Noise in Bilevel Images

AU - Barney Smith, Elisa H.

PY - 2009/10/13

Y1 - 2009/10/13

N2 - A new approach enables quantitative and qualitative characterization of varying edge noise even if the additive noise level is constant.

AB - A new approach enables quantitative and qualitative characterization of varying edge noise even if the additive noise level is constant.

UR - https://scholarworks.boisestate.edu/electrical_facpubs/92

U2 - 10.1117/2.1200910.1829

DO - 10.1117/2.1200910.1829

M3 - Article

JO - SPIE Online Newsroom

JF - SPIE Online Newsroom

ER -

New Metric Describes Edge Noise in Bilevel Images

Abstract

EGS Disciplines

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