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Noise rise in nondegenerate parametric amplifiers

  • University of California at Santa Cruz
  • Nokia

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

The noise-rise phenomenon is a long-standing problem that was first observed in Josephson-junction-parametric amplifiers over ten years ago. We present here a case where noise-rise data from a Josephson junction is successfully explained, using a theory based on the universal properties of a dynamical system operated near a bifurcation point. The experiment and theory presented here is for a bifurcation of the Hopf type, a case not discussed previously. The predicted behavior is qualitatively different from that of previously studied bifurcations.

Original languageEnglish
Pages (from-to)2641-2644
Number of pages4
JournalPhysical Review Letters
Volume66
Issue number20
DOIs
StatePublished - 1991

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