Abstract
Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.
Original language | English |
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Pages (from-to) | 59-61 |
Number of pages | 3 |
Journal | Electrochemical and Solid-State Letters |
Volume | 3 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2000 |