Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

C. A. Mims, N. I. Joos, P. A.W. Van Der Heide, A. J. Jacobson, C. Chen, C. W. Chu, B. I. Kim, S. S. Perry

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

Original languageEnglish
Pages (from-to)59-61
Number of pages3
JournalElectrochemical and Solid-State Letters
Volume3
Issue number1
DOIs
StatePublished - Jan 2000

Fingerprint

Dive into the research topics of 'Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia'. Together they form a unique fingerprint.

Cite this