Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

C. A. Mims; N. I. Joos; P. A.W. Van Der Heide; A. J. Jacobson; C. Chen; C. W. Chu; B. I. Kim; S. S. Perry

doi:10.1149/1.1390958

Oxygen transport in oxide thin film structures. Oriented La_0.5Sr_0.5CoO_3-x on single-crystal yttria-stabilized zirconia

C. A. Mims
, N. I. Joos
, P. A.W. Van Der Heide
, A. J. Jacobson
, C. Chen
, C. W. Chu
, B. I. Kim
, S. S. Perry

Physics Department

Research output: Contribution to journal › Article › peer-review

25 Scopus citations

Abstract

Oriented thin films of La_0.5Sr_0.5CoO_3-x were deposited on single-crystal 9.5 mol% Y₂O₃ stabilized ZrO₂ by laser deposition. The films were infused with ¹⁸O by exchange with 20 kPa O₂ at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

Original language	English
Pages (from-to)	59-61
Number of pages	3
Journal	Electrochemical and Solid-State Letters
Volume	3
Issue number	1
DOIs	https://doi.org/10.1149/1.1390958
State	Published - Jan 2000

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title = "Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia",

abstract = "Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol\% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.",

author = "Mims, \{C. A.\} and Joos, \{N. I.\} and \{Van Der Heide\}, \{P. A.W.\} and Jacobson, \{A. J.\} and C. Chen and Chu, \{C. W.\} and Kim, \{B. I.\} and Perry, \{S. S.\}",

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doi = "10.1149/1.1390958",

language = "English",

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T1 - Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

AU - Mims, C. A.

AU - Joos, N. I.

AU - Van Der Heide, P. A.W.

AU - Jacobson, A. J.

AU - Chen, C.

AU - Chu, C. W.

AU - Kim, B. I.

AU - Perry, S. S.

PY - 2000/1

Y1 - 2000/1

N2 - Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

AB - Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

UR - https://www.scopus.com/pages/publications/0033640342

U2 - 10.1149/1.1390958

DO - 10.1149/1.1390958

M3 - Article

AN - SCOPUS:0033640342

SN - 1099-0062

VL - 3

SP - 59

EP - 61

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

IS - 1

ER -

Oxygen transport in oxide thin film structures. Oriented La_0.5Sr_0.5CoO_3-x on single-crystal yttria-stabilized zirconia

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