Phase-resolved characterization of nanostructured reflective infrared quarter-wave plate

Wataru Nakagawa, Carol Baumbauer, Benjamin Moon, Orrin Boese, Jesse Lee, Skyler Rydberg, David L. Dickensheets

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Phase-resolved interferometric characterization of a nanostructured reflective quarter-wave plate for 1550 nm wavelength is presented. This device consists of a subwavelength-period grating in silicon with evaporated gold coating, and is compatible with standard fabrication processes.

Original languageEnglish
Title of host publicationOMN 2015 Jerusalem - 2015 International Conference on Optical MEMS and Nanophotonics, Proceedings
PublisherIEEE Computer Society
ISBN (Electronic)9781467368346
DOIs
StatePublished - 2 Oct 2015
EventInternational Conference on Optical MEMS and Nanophotonics, OMN 2015 - Jerusalem, Israel
Duration: 2 Aug 20155 Aug 2015

Publication series

NameInternational Conference on Optical MEMS and Nanophotonics
Volume02-05-August-2015
ISSN (Print)2160-5033
ISSN (Electronic)2160-5041

Conference

ConferenceInternational Conference on Optical MEMS and Nanophotonics, OMN 2015
Country/TerritoryIsrael
CityJerusalem
Period2/08/155/08/15

Keywords

  • infrared
  • interferometric characterization
  • nanophotonics
  • polarization
  • quarter-wave plate

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