Proton Beam Effects on Ge–Se/Ag Thin Films

Tyler Nichol; Dmitri Tenne; Maria Mitkova

doi:10.1002/pssb.201700453

Proton Beam Effects on Ge–Se/Ag Thin Films

Tyler Nichol, Dmitri Tenne, Maria Mitkova

Boise State University

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Original language	American English
Journal	Physica Status Solidi (B)
DOIs	https://doi.org/10.1002/pssb.201700453
State	Published - 1 Jun 2018

Keywords

chalcogenide glasses
conductive bridge random access memory
irradiation effects
memristors
proton irradiation
thin films

EGS Disciplines

Electrical and Computer Engineering

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10.1002/pssb.201700453License: Unspecified

http://dx.doi.org/10.1002/pssb.201700453

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title = "Proton Beam Effects on Ge–Se/Ag Thin Films",

keywords = "chalcogenide glasses, conductive bridge random access memory, irradiation effects, memristors, proton irradiation, thin films",

author = "Tyler Nichol and Dmitri Tenne and Maria Mitkova",

year = "2018",

month = jun,

day = "1",

doi = "10.1002/pssb.201700453",

language = "American English",

}

TY - JOUR

T1 - Proton Beam Effects on Ge–Se/Ag Thin Films

AU - Nichol, Tyler

AU - Tenne, Dmitri

AU - Mitkova, Maria

PY - 2018/6/1

Y1 - 2018/6/1

KW - chalcogenide glasses

KW - conductive bridge random access memory

KW - irradiation effects

KW - memristors

KW - proton irradiation

KW - thin films

UR - https://scholarworks.boisestate.edu/electrical_facpubs/388

UR - http://dx.doi.org/10.1002/pssb.201700453

U2 - 10.1002/pssb.201700453

DO - 10.1002/pssb.201700453

M3 - Article

JO - Physica Status Solidi (B)

JF - Physica Status Solidi (B)

ER -

Proton Beam Effects on Ge–Se/Ag Thin Films

Keywords

EGS Disciplines

Access to Document

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