Proton Irradiation Effect on Thermoelectric Properties of Nanostructured N-Type Half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01

Nicholas Kempf; Chinnathambi Karthik; Brian J. Jaques; Jonathan Gigax; Lin Shao; Darryl P. Butt; Ran He; Dezhi Wang; Zhifeng Ren; Yanliang Zhang

doi:10.1063/1.5025071

Proton Irradiation Effect on Thermoelectric Properties of Nanostructured N-Type Half-Heusler Hf_0.25Zr_0.75NiSn_0.99Sb_0.01

Nicholas Kempf, Chinnathambi Karthik, Brian J. Jaques, Jonathan Gigax, Lin Shao, Darryl P. Butt, Ran He, Dezhi Wang, Zhifeng Ren, Yanliang Zhang

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Thermoelectric properties of nanostructured half-Heusler Hf_0.25Zr_0.75NiSn_0.99Sb_0.01 were characterized before and after 2.5 MeV proton irradiation. A unique high-sensitivity scanning thermal microprobe was used to simultaneously map the irradiation effect on thermal conductivity and Seebeck coefficient with spatial resolution less than 2 μm. The thermal conductivity profile along the depth from the irradiated surface shows excellent agreement with the irradiation-induced damage profile from simulation. The Seebeck coefficient was unaffected while both electrical and thermal conductivities decreased by 24%, resulting in no change in thermoelectric figure of merit ZT. Reductions in thermal and electrical conductivities are attributed to irradiation-induced defects that act as scattering sources for phonons and charge carriers.

Original language	American English
Article number	243902
Journal	Applied Physics Letters
Volume	112
Issue number	24
DOIs	https://doi.org/10.1063/1.5025071
State	Published - 11 Jun 2018

Keywords

electrical conductivity
electronic transport
phonons
semiconductors
thermoelectric effects
materials analysis

EGS Disciplines

Materials Science and Engineering

Access to Document

10.1063/1.5025071

Proton Irradiation Effect on Thermoelectric Properties of NanostrFinal published version, 675 KBLicense: Unspecified
Proton Irradiation Effect on Thermoelectric Properties of NanostrFinal published version, 675 KBLicense: Unspecified

Cite this

@article{4161c305e3a14e16a4d92dc8f8dd1b28,

title = "Proton Irradiation Effect on Thermoelectric Properties of Nanostructured N-Type Half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01",

abstract = "Thermoelectric properties of nanostructured half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01 were characterized before and after 2.5 MeV proton irradiation. A unique high-sensitivity scanning thermal microprobe was used to simultaneously map the irradiation effect on thermal conductivity and Seebeck coefficient with spatial resolution less than 2 μm. The thermal conductivity profile along the depth from the irradiated surface shows excellent agreement with the irradiation-induced damage profile from simulation. The Seebeck coefficient was unaffected while both electrical and thermal conductivities decreased by 24%, resulting in no change in thermoelectric figure of merit ZT. Reductions in thermal and electrical conductivities are attributed to irradiation-induced defects that act as scattering sources for phonons and charge carriers.",

keywords = "electrical conductivity, electronic transport, phonons, semiconductors, thermoelectric effects, materials analysis",

author = "Nicholas Kempf and Chinnathambi Karthik and Jaques, {Brian J.} and Jonathan Gigax and Lin Shao and Butt, {Darryl P.} and Ran He and Dezhi Wang and Zhifeng Ren and Yanliang Zhang",

note = "Publisher Copyright: {\textcopyright} 2018 Author(s).",

year = "2018",

month = jun,

day = "11",

doi = "10.1063/1.5025071",

language = "American English",

volume = "112",

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TY - JOUR

T1 - Proton Irradiation Effect on Thermoelectric Properties of Nanostructured N-Type Half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01

AU - Kempf, Nicholas

AU - Karthik, Chinnathambi

AU - Jaques, Brian J.

AU - Gigax, Jonathan

AU - Shao, Lin

AU - Butt, Darryl P.

AU - He, Ran

AU - Wang, Dezhi

AU - Ren, Zhifeng

AU - Zhang, Yanliang

PY - 2018/6/11

Y1 - 2018/6/11

N2 - Thermoelectric properties of nanostructured half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01 were characterized before and after 2.5 MeV proton irradiation. A unique high-sensitivity scanning thermal microprobe was used to simultaneously map the irradiation effect on thermal conductivity and Seebeck coefficient with spatial resolution less than 2 μm. The thermal conductivity profile along the depth from the irradiated surface shows excellent agreement with the irradiation-induced damage profile from simulation. The Seebeck coefficient was unaffected while both electrical and thermal conductivities decreased by 24%, resulting in no change in thermoelectric figure of merit ZT. Reductions in thermal and electrical conductivities are attributed to irradiation-induced defects that act as scattering sources for phonons and charge carriers.

AB - Thermoelectric properties of nanostructured half-Heusler Hf0.25Zr0.75NiSn0.99Sb0.01 were characterized before and after 2.5 MeV proton irradiation. A unique high-sensitivity scanning thermal microprobe was used to simultaneously map the irradiation effect on thermal conductivity and Seebeck coefficient with spatial resolution less than 2 μm. The thermal conductivity profile along the depth from the irradiated surface shows excellent agreement with the irradiation-induced damage profile from simulation. The Seebeck coefficient was unaffected while both electrical and thermal conductivities decreased by 24%, resulting in no change in thermoelectric figure of merit ZT. Reductions in thermal and electrical conductivities are attributed to irradiation-induced defects that act as scattering sources for phonons and charge carriers.

KW - electrical conductivity

KW - electronic transport

KW - phonons

KW - semiconductors

KW - thermoelectric effects

KW - materials analysis

UR - https://scholarworks.boisestate.edu/mse_facpubs/345

U2 - 10.1063/1.5025071

DO - 10.1063/1.5025071

M3 - Article

SN - 0003-6951

VL - 112

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

M1 - 243902

ER -