Abstract
In this paper, we present a review of the state of the art in memristor technologies. Along with ionic conducting devices [i.e., conductive bridging random access memory (CBRAM)], we include phase change, and organic/organo-metallic technologies, and we review the most recent advances in oxide-based memristor technologies. We present progress on 3-D integration techniques, and we discuss the behavior of more mature memristive technologies in extreme environments.
| Original language | English |
|---|---|
| Article number | 7128486 |
| Pages (from-to) | 1004-1033 |
| Number of pages | 30 |
| Journal | Proceedings of the IEEE |
| Volume | 103 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1 Jul 2015 |
Keywords
- 3-D integration
- Memristor
- ReRAM
- radiation effects