Scanner Parameter Estimation Using Bilevel Scans of Star Charts

Elisa H. Barney Smith

doi:10.1109/ICDAR.2001.953968

Scanner Parameter Estimation Using Bilevel Scans of Star Charts

Elisa H. Barney Smith

Electrical Engineering Department

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Abstract

Scanning a high contrast image in bilevel mode results in image degradation. This is caused by two primary effects: blurring and thresholding. This paper expands on a method of estimating a joint distortion parameter, called the edge spread, from a star sector test chart in order to calculate the values of the point spread function width and binarization threshold. This theory is also described for variations in the source pattern which can represent degradations caused by repetition of the bilevel process as would be seen in printing then scanning, or in repeated photocopying. Estimation results are shown for the basic and extended cases.

Original language	American English
Journal	Proceedings Sixth International Conference on Document Analysis and Recognition, 2001
DOIs	https://doi.org/10.1109/ICDAR.2001.953968
State	Published - 1 Jan 2001

Keywords

astronomy computing
document image processing
finding charts

EGS Disciplines

Computer Engineering
Electrical and Computer Engineering

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10.1109/ICDAR.2001.953968License: Unspecified

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title = "Scanner Parameter Estimation Using Bilevel Scans of Star Charts",

abstract = " Scanning a high contrast image in bilevel mode results in image degradation. This is caused by two primary effects: blurring and thresholding. This paper expands on a method of estimating a joint distortion parameter, called the edge spread, from a star sector test chart in order to calculate the values of the point spread function width and binarization threshold. This theory is also described for variations in the source pattern which can represent degradations caused by repetition of the bilevel process as would be seen in printing then scanning, or in repeated photocopying. Estimation results are shown for the basic and extended cases.",

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AB - Scanning a high contrast image in bilevel mode results in image degradation. This is caused by two primary effects: blurring and thresholding. This paper expands on a method of estimating a joint distortion parameter, called the edge spread, from a star sector test chart in order to calculate the values of the point spread function width and binarization threshold. This theory is also described for variations in the source pattern which can represent degradations caused by repetition of the bilevel process as would be seen in printing then scanning, or in repeated photocopying. Estimation results are shown for the basic and extended cases.

KW - astronomy computing

KW - document image processing

KW - finding charts

UR - https://scholarworks.boisestate.edu/electrical_facpubs/27

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ER -

Scanner Parameter Estimation Using Bilevel Scans of Star Charts

Abstract

Keywords

EGS Disciplines

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