Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

Olivia Maryon; Kari Higginbotham; Medha Veligatla; Armen Kvryan; Peter Müllner; Paul H. Davis; Michael F. Hurley

Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

Olivia Maryon, Kari Higginbotham, Medha Veligatla, Armen Kvryan, Peter Müllner, Paul H. Davis, Michael F. Hurley

Micron School of Materials Science and Engineering

Boise State University

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Original language	American English
State	Published - 12 Apr 2019

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Scanning Probe Microscopy for Nanoscale Characterization of ElectFinal published version, 1.43 MBLicense: Unspecified

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@conference{e4b0139dbcb34e5b87cde6db40de2980,

title = "Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties",

author = "Olivia Maryon and Kari Higginbotham and Medha Veligatla and Armen Kvryan and Peter M{\"u}llner and Davis, {Paul H.} and Hurley, {Michael F.}",

year = "2019",

month = apr,

day = "12",

language = "American English",

}

TY - CONF

T1 - Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

AU - Maryon, Olivia

AU - Higginbotham, Kari

AU - Veligatla, Medha

AU - Kvryan, Armen

AU - Müllner, Peter

AU - Davis, Paul H.

AU - Hurley, Michael F.

PY - 2019/4/12

Y1 - 2019/4/12

UR - https://scholarworks.boisestate.edu/under_conf_2019/105

M3 - Presentation

ER -

Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

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