Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

Olivia Maryon; Kari Higginbotham; Medha Veligatla; Armen Kvryan; Peter Müllner; Paul H. Davis; Michael F. Hurley

Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

Olivia Maryon
, Kari Higginbotham
, Medha Veligatla
, Armen Kvryan
, Peter Müllner
, Paul H. Davis
, Michael F. Hurley

Micron School of Materials Science and Engineering

Boise State University

Research output: Contribution to conference › Presentation

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Original language	American English
State	Published - 12 Apr 2019

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Scanning Probe Microscopy for Nanoscale Characterization of ElectFinal published version, 1.43 MBLicense: Unspecified

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@conference{e4b0139dbcb34e5b87cde6db40de2980,

title = "Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties",

author = "Olivia Maryon and Kari Higginbotham and Medha Veligatla and Armen Kvryan and Peter M{\"u}llner and Davis, \{Paul H.\} and Hurley, \{Michael F.\}",

year = "2019",

month = apr,

day = "12",

language = "American English",

}

TY - CONF

T1 - Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

AU - Maryon, Olivia

AU - Higginbotham, Kari

AU - Veligatla, Medha

AU - Kvryan, Armen

AU - Müllner, Peter

AU - Davis, Paul H.

AU - Hurley, Michael F.

PY - 2019/4/12

Y1 - 2019/4/12

UR - https://scholarworks.boisestate.edu/under_conf_2019/105

M3 - Presentation

ER -

Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties

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