Abstract
Ge-chalcogenide films show various photo-induced changes, and silver photo-diffusion is one of them which attracts lots of interest. In this paper, we report how silver and Ge-chalcogenide layers in Ge 33 S 67 /Ag/Si substrate stacks change under light exposure in the depth by measuring time-resolved neutron reflectivity. It was found from the measurement that Ag ions diffuse all over the matrix Ge 33 S 67 layer once Ag dissolves into the layer. We also found that the surface was macroscopically deformed by the extended light exposure. Its structural origin was investigated by a scanning electron microscopy.
| Original language | American English |
|---|---|
| Journal | Journal of Applied Physics |
| DOIs | |
| State | Published - 7 Aug 2016 |
Keywords
- chalcogenides
- germanium
- neutrons
- reflectivity
- silver
EGS Disciplines
- Electrical and Computer Engineering
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