TY - GEN
T1 - Simulation Analysis of Noise Generation in a Re-Entrant Crossed-Field Amplifier
AU - Pearlman, Marcus
AU - Watrous, Jack
AU - Smithe, David
AU - Worthington, Michael
AU - Garner, Allen
AU - Browning, Jim
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Particle-in-cell simulations are used to showcase the transit wobble in electron spokes observed in areentrant crossed-field amplifier (CFA). The transit wobble period corresponds to the time for a spoke to transit 360o• This introduces a strong frequency component readily observable within the spoke, but not on the output signal. While the effects on the output are relatively unclear, a correlation between transit wobble and prominent side-bands is identified. The separation of the prominent side-bands from the operation frequency is often a harmonic of a sub-harmonic of the transit wobble frequency. This observation is important because it indicates possible avenues to reduce side-bands, such as designing CFAs to encourage a purely sinusoidal wobble to minimize sub-harmonics.
AB - Particle-in-cell simulations are used to showcase the transit wobble in electron spokes observed in areentrant crossed-field amplifier (CFA). The transit wobble period corresponds to the time for a spoke to transit 360o• This introduces a strong frequency component readily observable within the spoke, but not on the output signal. While the effects on the output are relatively unclear, a correlation between transit wobble and prominent side-bands is identified. The separation of the prominent side-bands from the operation frequency is often a harmonic of a sub-harmonic of the transit wobble frequency. This observation is important because it indicates possible avenues to reduce side-bands, such as designing CFAs to encourage a purely sinusoidal wobble to minimize sub-harmonics.
UR - http://www.scopus.com/inward/record.url?scp=85207053387&partnerID=8YFLogxK
U2 - 10.1109/IVECIVESC60838.2024.10694825
DO - 10.1109/IVECIVESC60838.2024.10694825
M3 - Conference contribution
AN - SCOPUS:85207053387
T3 - 2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024
BT - 2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference, IVEC + IVESC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 25th Joint IEEE International Vacuum Electronics Conference and 15th International Vacuum Electron Sources Conference, IVEC + IVESC 2024
Y2 - 23 April 2024 through 25 April 2024
ER -