Structural and Material Changes in Thin Film Chalcogenide Glasses Under Ar-Ion Irradiation

Tyler Nichol, Muhammad Rizwan Latif, Mahesh S. Ailavajhala, Dmitri A. Tenne, Maria Mitkova

Research output: Contribution to journalArticlepeer-review

4 Scopus citations
Original languageAmerican English
JournalElectrical and Computer Engineering Faculty Publications and Presentations
DOIs
StatePublished - 1 Dec 2014

Keywords

  • CBRAM
  • chalcogenide glasses
  • ion beam radiation
  • memristor array fabrication
  • memristors
  • PMC
  • radiation-induced effects
  • TRIM simulation

EGS Disciplines

  • Electrical and Computer Engineering

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