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Submicron ambipolar nanocrystalline-silicon TFTs with high-K gate dielectrics

  • Anand Subramaniam
  • , Kurtis D. Cantley
  • , Richard A. Chapman
  • , Harvey J. Stiegler
  • , Eric M. Vogel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Thin-film transistors (TFTs) that use hydrogenated nanocrystalline-silicon (nc-Si) as the channel material are favorable for use in neuromorphic circuits [1] as well as in flat-panel displays. Nanocrystalline-Si can be deposited over large areas at low temperatures, thus enabling three-dimensional integration with CMOS structures. Recently, nc-Si TFTs that exhibit high channel mobility and provide stable operation under voltage bias stress have been fabricated [2]. In this work, the subthreshold swing, electron and hole threshold voltages (V T), and field-effect mobilities are considerably improved by using high-K dielectrics instead of SiO 2. These gains will translate to circuits with lower operating voltages at the same performance.

Original languageEnglish
Title of host publication2011 International Semiconductor Device Research Symposium, ISDRS 2011
DOIs
StatePublished - 2011
Event2011 International Semiconductor Device Research Symposium, ISDRS 2011 - College Park, MD, United States
Duration: 7 Dec 20119 Dec 2011

Publication series

Name2011 International Semiconductor Device Research Symposium, ISDRS 2011

Conference

Conference2011 International Semiconductor Device Research Symposium, ISDRS 2011
Country/TerritoryUnited States
CityCollege Park, MD
Period7/12/119/12/11

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