Texture Dependence of the Martensitic Transformation in Ni-Mn-Ga Films Deposited on Alumina

Volodymyr Chernenko; Manfred Kohl; Stephen Doyle; Peter Mullner; Makoto Ohtsuka

Texture Dependence of the Martensitic Transformation in Ni-Mn-Ga Films Deposited on Alumina

Volodymyr Chernenko, Manfred Kohl, Stephen Doyle, Peter Mullner, Makoto Ohtsuka

Micron School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

Original language	American English
Journal	Scripta Materialia
Volume	54
Issue number	7
State	Published - Apr 2006

Keywords

Ni–Mn–Ga Heusler alloy; Thin films; Martensitic phase transformation; Texture

EGS Disciplines

Materials Science and Engineering

Cite this

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title = "Texture Dependence of the Martensitic Transformation in Ni-Mn-Ga Films Deposited on Alumina",

abstract = " X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.",

keywords = "Ni–Mn–Ga Heusler alloy; Thin films; Martensitic phase transformation; Texture",

author = "Volodymyr Chernenko and Manfred Kohl and Stephen Doyle and Peter Mullner and Makoto Ohtsuka",

year = "2006",

month = apr,

language = "American English",

volume = "54",

number = "7",

}

TY - JOUR

T1 - Texture Dependence of the Martensitic Transformation in Ni-Mn-Ga Films Deposited on Alumina

AU - Chernenko, Volodymyr

AU - Kohl, Manfred

AU - Doyle, Stephen

AU - Mullner, Peter

AU - Ohtsuka, Makoto

PY - 2006/4

Y1 - 2006/4

N2 - X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

AB - X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni–Mn–Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

KW - Ni–Mn–Ga Heusler alloy; Thin films; Martensitic phase transformation; Texture

UR - http://dx.doi.org/10.1016/j.scriptamat.2005.12.020

M3 - Article

VL - 54

JO - Scripta Materialia

JF - Scripta Materialia

IS - 7

ER -

Texture Dependence of the Martensitic Transformation in Ni-Mn-Ga Films Deposited on Alumina

Abstract

Keywords

EGS Disciplines

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