TY - JOUR
T1 - Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source
AU - Chernenko, V. A.
AU - Doyle, S.
AU - Kohl, M.
AU - Müllner, P.
AU - Besseghini, S.
AU - Ohtsuka, M.
PY - 2007
Y1 - 2007
N2 - Texture measurements of two series of Ni-Mn-Ga thin films, sputter-deposited on Mo foils, are performed as a function of both film and substrate thickness. X-ray diffraction experiments were carried out at the SR source ANKA in Germany. In contrast to 1μm-thick films showing 220-fibre texture, both in-plane and out-of-plane texture components are found in submicron films which correlates with the enhanced magnetostrain effect in these films.
AB - Texture measurements of two series of Ni-Mn-Ga thin films, sputter-deposited on Mo foils, are performed as a function of both film and substrate thickness. X-ray diffraction experiments were carried out at the SR source ANKA in Germany. In contrast to 1μm-thick films showing 220-fibre texture, both in-plane and out-of-plane texture components are found in submicron films which correlates with the enhanced magnetostrain effect in these films.
KW - Ni-Mn-Ga/Mo thin film composites
KW - Texture
KW - X-ray synchrotron diffraction
UR - http://www.scopus.com/inward/record.url?scp=41849109670&partnerID=8YFLogxK
U2 - 10.1524/zksu.2007.2007.suppl_26.229
DO - 10.1524/zksu.2007.2007.suppl_26.229
M3 - Article
AN - SCOPUS:41849109670
SN - 0930-486X
VL - 2
SP - 229
EP - 234
JO - Zeitschrift fur Kristallographie, Supplement
JF - Zeitschrift fur Kristallographie, Supplement
IS - 26
ER -