Tip-enhanced stimulated Raman scattering with ultra-high-aspect-ratio tips and confocal polarization Raman spectroscopy for evaluation of sidewalls in Type II superlattices FPAs

Fei Hung Chu, G. A. Smolyakov, C. F. Wang, Y. Gao, C. Wang, K. J. Malloy, A. A. Ukhanov, D. V. Pete, M. Jaime-Vasquez, N. F. Baril, J. D. Benson, D. A. Tenne

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Actoprobe team had developed custom Tip Enhancement Raman Spectroscopy System (TERS) with specially developed Ultra High Aspect Ratio probes for AFM and TERS measurements for small pixel infrared FPA sidewall characterization. Using this system, we report on stimulated Raman scattering observed in a standard tip-enhanced Raman spectroscopy (TERS) experiment on GaSb materials excited by 637-nm pump laser light. We explain our results by TERS-inherent mechanisms of enormous local field enhancement and by the special design and geometry of the ultrahigh-aspect-ratio tips that enabled conditions for stimulated Raman scattering in the sample with greatly enhanced resonance Raman gain when aided by a microcavity to provide feedback mechanism for the Raman emission. The approach has great potential for further, orders-of-magnitude, progress in TERS enhancement by significantly increasing its nonlinear component. We report development of novel class of probes for atomic force microscopy (AFM active optical probe - AAOP) by integrating a laser source and a photodetector monolithically into the AFM probe. The AAOPs are designed to be used in a conventional AFM and would enhance its functionality to include that of the instruments (NSOM, TERS, hybrid AFM).

Original languageEnglish
Title of host publicationNanoimaging and Nanospectroscopy VI
EditorsAlexander Egner, Prabhat Verma
DOIs
StatePublished - 2018
EventNanoimaging and Nanospectroscopy VI 2018 - San Diego, United States
Duration: 19 Aug 201821 Aug 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10726
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceNanoimaging and Nanospectroscopy VI 2018
Country/TerritoryUnited States
CitySan Diego
Period19/08/1821/08/18

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