Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes

Joseph W. Spinuzzi; Dmitri A. Tenne; T. H. Kim; C. B. Eom

Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes

Joseph W. Spinuzzi, Dmitri A. Tenne, T. H. Kim, C. B. Eom

Physics Department

Research output: Contribution to conference › Presentation

Abstract

Lead zirconate titanate, PbZr _1-x Ti _x O ₃ (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO ₃ substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.

Original language	American English
State	Published - 12 Jul 2016

EGS Disciplines

Condensed Matter Physics

Cite this

@conference{64e8623156194fc0b823718fe09e8d65,

title = "Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes",

abstract = " Lead zirconate titanate, PbZr 1-x Ti x O 3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO 3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.",

author = "Spinuzzi, {Joseph W.} and Tenne, {Dmitri A.} and Kim, {T. H.} and Eom, {C. B.}",

year = "2016",

month = jul,

day = "12",

language = "American English",

}

TY - CONF

T1 - Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes

AU - Spinuzzi, Joseph W.

AU - Tenne, Dmitri A.

AU - Kim, T. H.

AU - Eom, C. B.

PY - 2016/7/12

Y1 - 2016/7/12

N2 - Lead zirconate titanate, PbZr 1-x Ti x O 3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO 3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.

AB - Lead zirconate titanate, PbZr 1-x Ti x O 3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO 3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.

M3 - Presentation

ER -

Ultraviolet Raman Spectroscopy of Lead Zirconate Titinate Nanotubes

Abstract

EGS Disciplines

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